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54 C. Wartena and M. wibbels 14. Fuglede, B, Topsoe, F:Jensen-shannon divergence and hilbert space embedding In: Proc. of the Internat. Symposium on Information Theory, p. 31(2004) Wartena, C, Brussee, R, Wibbels, M. Using tag co-occurrence for recommenda on. In: ISDA, pp 273-278. IEEE Computer Society, Los Alamitos(2009) 16. Wartena, C, Brussee, R Instance-based mapping between thesauri and folk sonomies. In: International Semantic Web Conference, pp. 356-370(2008) 17. Calinski, T, Harabasz, J. A dendrite method for cluster analysis. Communications in Statistics Simulation and Computation 3(1), 1-27(1974) 18.http://dmirlab.tudelft.nl/users/maarten-clements 19. Rendle, S, Freudenthaler, C, Gantner, Z, Schmidt-Thieme, L: BPR: Bayesian personalized ranking from implicit feedback. In: Proceedings of the 25th Conference on Uncertainty in Artificial Intelligence, UAI 2009(2009) 20. Main Conference Proceedings of 2009 IEEE/WIC/ACM International Conference on Web Intelligence, WI 2009, Milan, Italy, September 15-18. IEEE, Los Alamitos54 C. Wartena and M. Wibbels 14. Fuglede, B., Topsoe, F.: Jensen-shannon divergence and hilbert space embedding. In: Proc. of the Internat. Symposium on Information Theory, p. 31 (2004) 15. Wartena, C., Brussee, R., Wibbels, M.: Using tag co-occurrence for recommenda￾tion. In: ISDA, pp. 273–278. IEEE Computer Society, Los Alamitos (2009) 16. Wartena, C., Brussee, R.: Instance-based mapping between thesauri and folk￾sonomies. In: International Semantic Web Conference, pp. 356–370 (2008) 17. Cali´nski, T., Harabasz, J.: A dendrite method for cluster analysis. Communications in Statistics Simulation and Computation 3(1), 1–27 (1974) 18. http://dmirlab.tudelft.nl/users/maarten-clements 19. Rendle, S., Freudenthaler, C., Gantner, Z., Schmidt-Thieme, L.: BPR: Bayesian personalized ranking from implicit feedback. In: Proceedings of the 25th Conference on Uncertainty in Artificial Intelligence, UAI 2009 (2009) 20. Main Conference Proceedings of 2009 IEEE/WIC/ACM International Conference on Web Intelligence, WI 2009, Milan, Italy, September 15-18. IEEE, Los Alamitos (2009)
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