Specifications CD4518BMS, CD4520BMS TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25 C PARAMETER SYMBOL DELTA LIMIT Supply Current-MS1-2 ±1.0uA Output Current (Sink) 儿5±20% X Pre-Test Reading Output Current(Source) IOH5A=+ 20% x Pre-Test Reading TABLE 6. APPLICABLE SUBGROUPS MIL-STD-883 CONFORMANCE GROUP GROUP A SUBGROUPS READ AND RECORD I Initial Test(Pre Burn-in) 100%5004 1.7.9 IDD. IOL5. 1OH5A Interim Test 1(Post Burn-In) 100%5 1,7,9 IDD. IOL5. IOH5A terim Test 2(Post Burn-In) 100%5004 1,7,9 DD. IOL5 IOH 5A PDA(Note 1) 100%5004 1.7.9. Deltas Interim Test 3( Post Burn-In) 100%5004 1,7,9 IDD. IOL5. 10H5A PDA(Note 1) 100%5004 1.7.9. Deltas Final Test 100%5004 2,3,8A,8B,10,11 Sample 5005 1,2,3,7,8A,8B,9,10,11 Group B Subgroup B-5 Sample500512378A8B,9,10,11Deas| Subgroups1,2,39,10.11 Subgroup B-6 Sample 5005 1,7,9 GroupD Subgroups 1, 23 NOTE: 1. 5% Parameteric 3% Functional: Cumulative for Static 1 and 2 TABLE 7. TOTAL DOSE IRRADIATION MIL-STD-883 TEST READ AND RECORD CONFORMANCE GROUPS METHOD PRERRAD POST-RRAD PRE-RRAD POST-IRRAD Group E Subgroup 2 5005 1.7.9 Table 4 1.9 Table 4 TABLE 8 BURN-IN AND IRRADIATION TEST CONNECTIONS OSCILLATOR FUNCTION GROUND ±5025H I Static Bum-In1 3-6.11-14 1,2,7-10,15 Note 1 Static Bum -In 2 3-6.11-14 8 1,2,7,9,10, Note 1 15.16 In Note 1 Irradiation 3-6,11-14 1,2,7,9,10, Note 2 15.16 NOTES: 1. Each pin ex 2. Each pin except VDD and GND will have a series resistor of 47K+ 5%: Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, 7-12107-1210 Specifications CD4518BMS, CD4520BMS TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25oC PARAMETER SYMBOL DELTA LIMIT Supply Current - MSI-2 IDD ± 1.0µA Output Current (Sink) IOL5 ± 20% x Pre-Test Reading Output Current (Source) IOH5A ± 20% x Pre-Test Reading TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUP MIL-STD-883 METHOD GROUP A SUBGROUPS READ AND RECORD Initial Test (Pre Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A Interim Test 1 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A Interim Test 2 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A PDA (Note 1) 100% 5004 1, 7, 9, Deltas Interim Test 3 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A PDA (Note 1) 100% 5004 1, 7, 9, Deltas Final Test 100% 5004 2, 3, 8A, 8B, 10, 11 Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11 Subgroup B-6 Sample 5005 1, 7, 9 Group D Sample 5005 1, 2, 3, 8A, 8B, 9 Subgroups 1, 2 3 NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2. TABLE 7. TOTAL DOSE IRRADIATION CONFORMANCE GROUPS MIL-STD-883 METHOD TEST READ AND RECORD PRE-IRRAD POST-IRRAD PRE-IRRAD POST-IRRAD Group E Subgroup 2 5005 1, 7, 9 Table 4 1, 9 Table 4 TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS FUNCTION OPEN GROUND VDD 9V ± -0.5V OSCILLATOR 50kHz 25kHz Static Burn-In 1 Note 1 3-6, 11-14 1, 2, 7-10, 15 16 Static Burn-In 2 Note 1 3-6, 11-14 8 1, 2, 7, 9, 10, 15, 16 Dynamic Burn￾In Note 1 - 7, 8, 15 2, 10, 16 3-6, 11-14 1, 9 Irradiation Note 2 3-6, 11-14 8 1, 2, 7, 9, 10, 15, 16 NOTES: 1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V 2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ± 0.5V