PSSD-Topics 1.Basic work such as identification of defects:defect formation, migration,agglomeration and annealing. 2.Momentum distribution studies of defects:coincidence Doppler broadening,angular correlation of annihilation radiation (ACAR) 3.Low-k/High-k dielectric insulating materials in semiconductor devices 4.Theoretical calculations of momentum distributions and positron lifetimes 5.Slow beam studies of surface and near surface regions of semiconductors 6.High resolution positron lifetime studies of semiconductors 7.Semiconductor defects studied by the experimental methods other than positron annihilation 8.Industrial application of positron annihilation to semiconductor devices.PSSD-Topics 1. Basic work such as identification of defects: defect formation, migration, agglomeration and annealing. 2. Momentum distribution studies of defects: coincidence Doppler broadening, angular correlation of annihilation radiation (ACAR). 3. Low-k/High-k dielectric insulating materials in semiconductor devices 4. Theoretical calculations of momentum distributions and positron lifetimes 5. Slow beam studies of surface and near surface regions of semiconductors 6. High resolution positron lifetime studies of semiconductors 7. Semiconductor defects studied by the experimental methods other than positron annihilation 8. Industrial application of positron annihilation to semiconductor devices