3.5边界扫描结构 必测试访问端口 (TAP) (4-5额外引腿) 测试数据输入(TDI) -测试数据输出(TDO) -测试时钟(TCK) -测试模式选择(TMS) ”寄存器组 -指令寄存器 (IR) -数据寄存器(DR):旁路寄存器,边界扫描寄存器,ID寄存器 Mandatory:Boundary scan register and Bypass register Optional:Device-ID register,Design-Specific registers, etc. TAP控制器 一 A finite state machine with 16 states Input TCK,TMS Output 9 or 10 signals included ClockDR, UpdateDR, ShiftDR,ClockIR,UpdateIR,ShiftIR, Select,Enable, TCK and the optional TRST*. 2020/9/5 集成电路可测性设计 143.5 边界扫描结构 测试访问端口 (TAP) ( 4 - 5额外引腿) 测试数据输入 (TDI) 测试数据输出 (TDO) 测试时钟 (TCK) 测试模式选择 (TMS) 寄存器组 指令寄存器 (IR) 数据寄存器 (DR): 旁路寄存器, 边界扫描寄存器, ID寄存器 Mandatory: Boundary scan register and Bypass register Optional: Device-ID register, Design-Specific registers, etc. TAP 控制器 A finite state machine with 16 states Input : TCK, TMS Output : 9 or 10 signals included ClockDR, UpdateDR, ShiftDR, ClockIR, UpdateIR, ShiftIR, Select, Enable, TCK and the optional TRST*. 2020/9/5 集成电路可测性设计 14