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276 C -H. Chao, H.Y. Lu/Materials Science and Engineering 4328(2002)267-276 Acknowledgements [I E.S. Thomas, J.G. Thompson, R L. Withers, M. Sterns, Y Xiao, RJ. Kirkpartick, J. Am. Ceram Soc. 77(1994)49 This research was financed by the National Science 12A.G. Verduch, J. Am. Ceram. Soc. 41(1958)327. Council of Taiwan through NSC-82-0405-D-110-003 (14 B.D. Cullity, Introduction to X-ray Diffraction, Addison and83-0405-D-110-001 [5 E.H. Bogardus, R. Roy, J. Am. Ceram Soc. 48 [16 H.I. Hsiang, F.S. Yen, J. Am. Ceram. References [7 A H. Heuer, J. Am. Ceram Soc. 70(1987)689. [18 F.E. Wagstaff, J. Am. Ceram. Soc. 51(1968)449 P.J. Heaney, in: P.J. Heaney, C.T. Prewitt(Eds ) Silica-Physical [19 C.H. Chao, PhD thesis, National Sun Yat-Sen University, Tai- Behaviour, Geochemistry and Material Applications, Mineral wan,1998 Soc. Am, Washington, DC, 1994, pp. 1-40 [20 C H. Chao, H.Y. Lu, Mater. Sci. Eng. A282(2000)123 2]KD. Hammonds, M.T. Dove, A P. Giddy, V. Heine, B. Win- 21]M.H. Lewis, J. 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