Material Characterization LM-FFM (Lateral Modulation FFM) SII C Seiko Instruments Inc 【 Purpose Friction Force Microscope Lateral Modulation FFM O Mapping friction force distributed sample surface Twisting Distortion Twisting Amplitude 【 Principle 走1 (小) 走查 o Imaging lateral amplitude of a cantilever, while a sample is Small ve Large ve laterally vibrated Sm叫V Large ve 【 Advantage】 Simultaneous observation Effect Lateral modulation of topography and friction force. Valid for imaging material character distinction of a compound which does not be FFM出力 LM一FFM出力 judged from the topography Image. Twisting distortio Twisting Amplitude 【 Application ◆ Lubricant· organic compound polymer plastic rubber Sample: oil/ Polystyrene Sheet Topography(5 u m) FFM LM一FFM【Purpose】 ◆Mapping friction force distributed sample surface. 【Principle】 ◆ Imaging lateral amplitude of a cantilever, while a sample is laterally vibrated. 【Advantage】 ◆Simultaneous observation of topography and friction force. ◆Valid for imaging material character distinction of a compound which does not be judged from the topography image. 【Application】 ◆Lubricant・organic compound・ polymer・plastic・ rubber Lateral Modulation Edge Effect Twisting distortion Twisting Amplitude Topography（5μｍ） ＦＦＭ ＬＭ－ＦＦＭ Sample : Oil/Polystyrene Sheet Material Characterization LM-FFM（Lateral Modulation FFM） Friction Force Microscope Lateral Modulation FFM Twisting Distortion Twisting Amplitude Small VE Large VE Small VE Large VE