Time of Flight (TOF) SIMs-Reflectron http://www.youtube.com/watch?v=zoauxsebunkTof-sims http://www.youtube.com/watch?v=kawu6smvhjc 1. Ion source with a TOF SIMS is based on the fact that ions with the same energy but different masses travel pulsed a g0 deflector with different velocities. Basically, ions formed 2. Liquid metal by a short ionization event are accelerated by source an electrostatic field to a common energy and 3. target travel over a drift path to the detector. The 4. Single stage reflector lighter ones arrive before the heavier ones and 5. Detector a mass spectrum is recorded. Measuring the flight time for each ion allows the determination of its mass 日::日 5 (TOF) SIMS enables the analysis of an unlimited mass range with high sensitiv ity and quasi-simultaneous detection of all secondary Schematic of time of flight ( TOF) ions collected by the mass spectrometerTime of Flight (TOF) SIMS - Reflectron (TOF) SIMS enables the analysis of an unlimited mass range with high sensitivity and quasi-simultaneous detection of all secondary ions collected by the mass spectrometer. TOF SIMS is based on the fact that ions with the same energy but different masses travel with different velocities. Basically, ions formed by a short ionization event are accelerated by an electrostatic field to a common energy and travel over a drift path to the detector. The lighter ones arrive before the heavier ones and a mass spectrum is recorded. Measuring the flight time for each ion allows the determination of its mass. Schematic of time of flight (TOF) spectrometer - reflectron http://www.youtube.com/watch?v=ZoAUxsEBUnk TOF-SIMS http://www.youtube.com/watch?v=KAWu6SmvHjc