Advantages of Using SEM over OM Magnification Depth of Field Resolution OM4x-1000X155m-019m 0.2um SEM10x-3000000X4mm-04um 1-10nm The sEM has a large depth of field, which allows a large amount of the sample to be in focus at one time and produces an image that is a good representation of the three-dimensional sample. The SEM also produces images of high resolution, which means that closely features can be examined at a high magnification The combination of higher magnification, larger depth of field, greater resolution and com positional and crystallographic information makes the SEM one of the most heavily used instruments in research areas and industries, especially in semiconductor industry.Advantages of Using SEM over OM Magnification Depth of Field Resolution OM 4x – 1000x 15.5mm – 0.19mm ~ 0.2mm SEM 10x – 3000000x 4mm – 0.4mm 1-10nm The SEM has a large depth of field, which allows a large amount of the sample to be in focus at one time and produces an image that is a good representation of the three-dimensional sample. The SEM also produces images of high resolution, which means that closely features can be examined at a high magnification. The combination of higher magnification, larger depth of field, greater resolution and compositional and crystallographic information makes the SEM one of the most heavily used instruments in research areas and industries, especially in semiconductor industry