Scanning Electron Microscope a Totally Different Imaging Concept e Instead of using the full-field image, a point- to-point measurement strategy is used e High energy electron beam is used to excite the specimen and the signals are collected and analyzed so that an image can be constructed e The signals carry topological, chemical and crystallographic information, respectively of the samples surface https://www.youtube.com/watch?v=vwxyszpttsiatw4:18-4:38 http://www.youtube.com/watch?v=irxmighanbgatn4:16-4:42 https://www.youtube.com/watch?v=npskvg]ktdiScanning Electron Microscope – a Totally Different Imaging Concept • Instead of using the full-field image, a point￾to-point measurement strategy is used. • High energy electron beam is used to excite the specimen and the signals are collected and analyzed so that an image can be constructed. • The signals carry topological, chemical and crystallographic information, respectively, of the samples surface. http://www.youtube.com/watch?v=lrXMIghANbg at~4:16-4:42 https://www.youtube.com/watch?v=VWxYsZPtTsI at~4:18-4:38 https://www.youtube.com/watch?v=nPskvGJKtDI