Applications of AFM Poly mers high-resolution profiling of surface morphology, nanostructure, and molecular order tudies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure Semiconductors Atomic Force Profilometry for Characterzation of chemical mechanical Planarization Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors Atomic Force Microscopy Measurements in Support of Chemical Mechanical Polishing(CMP IC Failure Analysis and Defect Inspection with SPM Data Storage Magnetic Force Microscopy: High-Resolution Imaging for Data Storage Applications of Atomic Force Microscopy in Optical Disc TechnologyPolymers high-resolution profiling of surface morphology, nanostructure, and molecular order studies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure Semiconductors • Atomic Force Profilometry for Characterzation of Chemical Mechanical Planarization • Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors • Atomic Force Microscopy Measurements in Support of Chemical Mechanical Polishing (CMP) • IC Failure Analysis and Defect Inspection with SPM Data Storage • Magnetic Force Microscopy: High-Resolution Imaging for Data Storage • Applications of Atomic Force Microscopy in Optical Disc Technology Applications of AFM