Application of Atomic force Microscopy for Polymers Yanchun han
Application of Atomic Force Microscopy for Polymers Yanchun Han
Applications of AFM Biology and biomaterials Applications of Atomic Force Microscopy for Contact Lens Manufacturing Applications for the biological Sciences Direct Measurement of single Immunocomplex Formation by Atomic Force Microscopy High Resolution Imaging of Biological Samples by Scanning Probe Microscopy Materials Science Electrical Testing Application Modules for Nano Scope Scanning Probe Microscopes Electric Force Microscopy, Surface Potential Imaging and Surface Electric Modification with the (AFM Studies of Metallic Surfaces and Microstructures With Atomic Force Microscopy Using Atomic Force Microscopy for Engineering Low Scatter Thin Film Optics Electrochemical Applications of Scanning Probe Microscopy Nanoindentation, Scratching and Wear Testing Using Scanning Probe Microscopy
Biology and Biomaterials • Applications of Atomic Force Microscopy for Contact Lens Manufacturing • Applications for the Biological Sciences • Direct Measurement of single Immunocomplex Formation by Atomic Force Microscopy • High Resolution Imaging of Biological Samples by Scanning Probe Microscopy Materials Science • Electrical Testing Application Modules for NanoScope Scanning Probe Microscopes • Electric Force Microscopy, Surface Potential Imaging and Surface Electric Modification with the (AFM) • Studies of Metallic Surfaces and Microstructures With Atomic Force Microscopy • Using Atomic Force Microscopy for Engineering Low Scatter Thin Film Optics • Electrochemical Applications of Scanning Probe Microscopy • Nanoindentation, Scratching and Wear Testing Using Scanning Probe Microscopy Applications of AFM
Applications of AFM Poly mers high-resolution profiling of surface morphology, nanostructure, and molecular order tudies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure Semiconductors Atomic Force Profilometry for Characterzation of chemical mechanical Planarization Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors Atomic Force Microscopy Measurements in Support of Chemical Mechanical Polishing(CMP IC Failure Analysis and Defect Inspection with SPM Data Storage Magnetic Force Microscopy: High-Resolution Imaging for Data Storage Applications of Atomic Force Microscopy in Optical Disc Technology
Polymers high-resolution profiling of surface morphology, nanostructure, and molecular order studies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure Semiconductors • Atomic Force Profilometry for Characterzation of Chemical Mechanical Planarization • Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors • Atomic Force Microscopy Measurements in Support of Chemical Mechanical Polishing (CMP) • IC Failure Analysis and Defect Inspection with SPM Data Storage • Magnetic Force Microscopy: High-Resolution Imaging for Data Storage • Applications of Atomic Force Microscopy in Optical Disc Technology Applications of AFM
SPM Application in polymer material Phase Separation Structure) Lamella Structure ABS resin LD, MD, HD- Polyethylene PC/AES alloy Linear Ld Polyethylene PC/ABS alloy UH Molecular Weight PE ABS/PVC alloy Polypropylene etc etc Next generation Thermoplastic Elastomer Conducting Polymer Styrene butadiene- Organic el Polyester- Biodegradable polymer Polyvinyl Chloride- etc
Phase Separation Structure ・ABS resin ・PC/AES alloy ・PC/ABS alloy ・ABS/PVC alloy etc Lamella Structure ・LD-, MD-, HD- Polyethylene ・Linear LD Polyethylene ・UH Molecular Weight PE ・Polypropylene etc Next Generation ・Conducting Polymer ・Organic EL ・Biodegradable Polymer etc Thermoplastic Elastomer ・Styrene Butadiene- ・Polyester- ・Polyvinyl Chlorideetc SPM Application in Polymer Material
Applications of AFM for Polymers high-resolution profiling of surface morphology, nanostructure, and molecular order studies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure
high-resolution profiling of surface morphology, nanostructure, and molecular order studies of local materials properties compositional mapping of heterogeneous samples probing of sub-surface sample structure Applications of AFM for Polymers
Structure and Function of polymer Morphology observation with SPM OObservation in the heating process with the air Surface and interface Information OObservation in the inert gas ODifficult sample for TEM(Rubber/Rubber blend) Structure Function Heating/Cooling S PM
Structure Function Heating/Cooling ＳＰＭ ●Observation in the heating process with the air ●Surface and Interface Information ●Observation in the inert gas ●Difficult sample for TEM（Rubber/Rubber blend） Structure and Function of Polymer ー Morphology observation with SPM ー
Material Characterization using SPM Visco-elasticity VE-AFM/DEM Phase Friction force Polymer characterization in PM nano scale level FFMLM-FFM Hardness Adhesive Force adhesio Glass trans
Visco-elasticity Friction Force Adhesive Force Glass trans. Phase Hardness Polymer characterization in nano scale level VE-AFM/DFM PM FFM/LM-FFM Adhesion Material Characterization using SPM
Studies of polymer surfaces with afm 研究内容:高分子形态、纳米结构、链堆砌和构象等 手段: Contact Mode AFM LFM TappingMode
Studies of Polymer Surfaces with AFM 研究内容：高分子形态、纳米结构、链堆砌和构象等 手段： Contact Mode AFM LFM TappingMode
Material Characterization DFM/PM (Phase mode) measurement 【 Purpose Distribution of the characteristics change in the polymer surface can e observed ( Principle Detecting the phase change in DFM measurement 【 Advantage o Simultaneous imaging with DFM Same advantage as DFM for the soft or charged surface (which is difficult to apply lM-FFM or VE-AFM) Topography(7um) age(7um) resin Observed image of the heat shrinkage rubber silicon (resin/silicon rubber) rubber
【Purpose】 ◆ Distribution of the characteristics change in the polymer surface can be observed. 【Principle】 ◆Detecting the phase change in DFM measurement 【Advantage】 ◆Simultaneous imaging with DFM ◆Same advantage as DFM for the soft or charged surface. (which is difficult to apply LM-FFM or VE-AFM) resin silicon rubber Topography（７μｍ） PM image（７μｍ） Material Characterization DFM／PM （Phase mode）measurement Observed image of the heat shrinkage rubber （resin/silicon rubber） →
Phase(PM: Phase Mode) measurement Structure and function of polymer (SPA-300HV, Environment Control Type Unit Data No. 1 Lamella structure of Polypropylene Topography PM image 100nm 100nr EPR LAmella structure can be observed clearly with PM mode. ODomain of Ethylene Propylene Rubber(EPR)is distributed in the Polypropylene(PP)matrix
100 nm 100 nm Topography PM image EPR PP （matrix） ●Lamella structure can be observed clearly with PM mode. ●Domain of Ethylene Propylene Rubber (EPR) is distributed in the Polypropylene (PP) matrix. （ SPA-300HV, Environment Control Type Unit） Data No.１ Lamella structure of Polypropylene Phase（PM：Phase Mode）measurement － Structure and Function of Polymer －