AFM The Atomic Force Microscope(AFM)was developed from the Scanning Tunneling Microscope STM)in 1986 by Binning, Quate and Gerber. The limitation of the STMin only being able to image conducting materials was overcome by the Force Microscope This microscope neitherneeds the sample or the tip to be conductive,a huge development in the imaging of biological surfaces The two main Applications of aFm are Imaging and Force Distance curves With regards to imaging, the advances since 1986 have been astonishing. Atomic force Microscopy Provides quantitative, three dimensionalimages and surface measurements with extremely high resolution, which can be of the order of10 to 20 Angstroms Many surface structures have been revealed from the first images of lamellar materials in 1987, through to images of DNA, and proteinsin 1988.The Atomic Force Microscope (AFM) was developed from the Scanning Tunneling Microscope (STM) in 1986 by Binning, Quate and Gerber. The limitation of the STM in only being able to image conducting materials was overcome by the Force Microscope. This microscope neither needs the sample or the tip to be conductive,a huge development in the imaging of biological surfaces. The two main Applications of AFM are Imaging and Force Distance Curves. With regards to imaging, the advances since 1986 have been astonishing. Atomic Force Microscopy Provides quantitative, three￾dimensional images and surface measurements with extremely high resolution, which can be of the order of10 to 20 Angstroms. Many surface structures have been revealed from the first images of lamellar materials in 1987, through to images of DNA, and Proteinsin 1988. AFM