History of scanning Probe Microscope 1981 Heinrich Rohrer and Gerd Binnig develop the first scanning tunneling microscope (STM at IBM Zurich (Nobel Prize 1986) Atomic image of Si(7x7 oln this technique a sharp metal tip is positioned over the conducting sample. A small potential difference is then applied between the tip and the sample. Electrons"tunnel"through the Gap between the tip and the sample into the tip and vice versa oThe tip is then scanned across the surface of the sample. The signal that gets detected is the Tunnel Current oThe result is a Topographical image of atoms on a surface, achieved by recording the tip height at each locationHistory of Scanning Probe Microscope Atomic image of Si(7x7) 1981 Heinrich Rohrer and Gerd Binnig develop the first scanning tunneling microscope (STM) at IBM Zurich (Nobel Prize 1986) ⚫In this technique a sharp metal Tip is positioned over the conducting sample. A small potential difference is then applied between the tip and the sample. Electrons "tunnel"through the Gap between the tip and the sample into the tip and vice versa. ⚫The tip is then scanned across the surface of the sample. The signal that gets detected is the Tunnel Current ⚫The result is a Topographical image of atoms on a surface, achieved by recording the tip height at each location