information, referred to as data acquisition, is discussed next. No digital system is released to production without extensive testing. Chapter 85 presents methods of testing and design for testing The variety of topics presented in this section should provide readers with a contemporary overview of digital devices and their applications. To obtain additional information, the reader may refer to the References and Further Information in each chapter Nomenclature Symbol Quantity 入 radiation wavelength nm average magnification factor coefficient electron mobility luminance off the projection screen photon frequency brightness contrast mμnvpRRS photon momentum kg. m/s CMrR common-mode rejection recombination rate ratio festivity C contrast ratio mitting screen surface diameter ignal-to-noise ratio E band gap energy add time screen efficiency focal length propagation delay time aximum flux transmission ratio Plancks constant 6.626× hTTt transmission of faceplate 10-3J·s lifetime quantum efficiency qvv critical angle beam current accelerating voltage luminance creen voltage© 2000 by CRC Press LLC information, referred to as data acquisition, is discussed next. No digital system is released to production without extensive testing. Chapter 85 presents methods of testing and design for testing. The variety of topics presented in this section should provide readers with a contemporary overview of digital devices and their applications. To obtain additional information, the reader may refer to the References and Further Information in each chapter. Nomenclature Symbol Quantity Unit A area m2 a average absorption coefficient B luminance off the projection screen C brightness contrast CMRR common-mode rejection ratio CR contrast ratio d diameter m Eg band gap energy eV e screen efficiency lumen/W f focal length m F maximum flux lumen h Planck’s constant 6.626 ¥ 10–34 J·s h quantum efficiency I beam current amp L luminance cd/m2 L raster luminance Symbol Quantity Unit l radiation wavelength nm m magnification factor mn electron mobility n aperture n photon frequency Hz p photon momentum kg · m/s R recombination rate ns Ri reflectivity S emitting screen surface m2 SNR signal-to-noise ratio tadd add time ns th hold time ns tpd propagation delay time ns T transmission ratio T transmission of faceplate t lifetime ns qc critical angle degree VB accelerating voltage V Vs screen voltage V 8574/sn08/frame Page 1768 Saturday, May 23, 1998 4:15 PM