Sandige. R.S. "Section VIll- Digital Devices The Electrical Engineering Handbook Ed. Richard C. Dorf Boca raton crc Press llc. 2000
Sandige, R.S. “Section VIII – Digital Devices” The Electrical Engineering Handbook Ed. Richard C. Dorf Boca Raton: CRC Press LLC, 2000
LCD projection televisions, such as this Television of the Future"could replace the CrT-based television if certain performance criteria are obtained. One criteria being addressed is the need for a very bright, optically efficient point source for projecting an image through a small LCD. If new lighting technologies are developed, such as an illumination source that can provide a brighter image with better colors than current CrT technology, then the consumer television market will certainly change. Photo courtesy of Thomson Multimedia e 2000 by CRC Press LLC
© 2000 by CRC Press LLC LCD projection televisions, such as this “Television of the Future” could replace the CRT-based television if certain performance criteria are obtained. One criteria being addressed is the need for a very bright, optically efficient point source for projecting an image through a small LCD. If new lighting technologies are developed, such as an illumination source that can provide a brighter image with better colors than current CRT technology, then the consumer television market will certainly change. (Photo courtesy of Thomson Multimedia.) 8574/ch078/frame Page 1766 Wednesday, May 6, 1998 11:08 AM
Digital Devices 79 Logic Elements G L Moss, P. Graham, R.S. Sandige, H.S. Hinton C Logic Family Operation and Characteristics. Logic Gates(IC). Bistable Devices. Optical Memory Devices WD Integrated Circuits(RAM, RO R.H. Katz, P.A. Lee, M. Mansuriput netic Tap Basic Disc System Architectures. Mag Magneto-Optical Disk Data 81 Logical Devices F.P. Preparata, R.S. Sandige, B R. Bannister, D.G. Whitehead, M. Bolton B D. carroll Circuits. Registers and their ble Arrays. Arithmetic 82 Microprocessors J. Staudhammer, S.-L. Chen, P.J. Windley J F frenzel 83 Displays J.E. Morris, A. Martin Weber Light-Emitting Diodes. Liquid-Crystal Displays. The Cathode Ray Tube.Color Plasma 4 Data Acquisition D. Kurumbalapitiya, S.R. H. Hoole The Analog and Digital Signal Interface. Analog Signal Conditioning. Sample-and-Hold and A/D Techniques in Data Acquisition. The Communication Interface of a Data Acquisition 85 Testing M. Serra, B I. Dervisogu Digital IC Testing Design for Test Richard S Sandie University of wyoming E ECTRONIC DESIGNERS have placed increasing significance on digital devices since the late 1960s his is due primarily to the greater reliability and improved accuracy gained when using electronic devices in a two-level mode(binary mode) as compared to using electronic devices in a continuou (analog mode). As silicon integrated circuits(ICs) became denser and more consistently reproducible over the past few decades, so did digital electronic devices. Today digital circuits and digital systems produced from digital devices can be found in every walk of life ranging from children's toys, kitchen appliances, laboratory nstruments, personal and workstation computers to space shuttle and satellite application The intent of this section is to present topics related to the utilization and application of digital devices Chapter 79 establishes the foundation for digital logic elements beginning with IC, logic gates, logical families, bistable devices, and optical devices. Discussed in the next chapter are memory devices, which include integrated circuits(RAM, ROM), disk systems, magnetic tape, and optical disks. Chapter 81 on logical devices discusses switching algebra, logic circuits, registers, programmable arrays(PAL, FPGA), and arithmetic logic units t The next chapter explains the microprocessor, perhaps the best-known digital device. The topics covered clude practical microprocessors and microprocessor applications. Chapter 83 on displays consists of the light mitting diode, the liquid-crystal display, the cathode ray tube, and the plasma display. The gathering of digital c 2000 by CRC Press LLC
© 2000 by CRC Press LLC VIII Digital Devices 79 Logic Elements G.L. Moss, P. Graham, R.S. Sandige, H.S. Hinton IC Logic Family Operation and Characteristics • Logic Gates (IC) • Bistable Devices • Optical Devices 80 Memory Devices W.D. Pricer, R.H. Katz, P.A. Lee, M. Mansuripur Integrated Circuits (RAM, ROM) • Basic Disc System Architectures • Magnetic Tape • Magneto-Optical Disk Data Storage 81 Logical Devices F.P. Preparata, R.S. Sandige, B.R. Bannister, D.G. Whitehead, M. Bolton, B.D. Carroll Combinational Networks and Switching Algebra • Logic Circuits • Registers and their Applications • Programmable Arrays • Arithmetic Logic Units 82 Microprocessors J. Staudhammer, S.-L. Chen, P.J. Windley, J.F. Frenzel Practical Microprocessors • Applications 83 Displays J.E. Morris, A. Martin, L.F. Weber Light-Emitting Diodes • Liquid-Crystal Displays • The Cathode Ray Tube • Color Plasma Displays 84 Data Acquisition D. Kurumbalapitiya, S.R.H. Hoole The Analog and Digital Signal Interface • Analog Signal Conditioning • Sample-and-Hold and A/D Techniques in Data Acquisition • The Communication Interface of a Data Acquisition System • Data Recording • Software Aspects 85 Testing M. Serra, B.I. Dervisoglu Digital IC Testing • Design for Test Richard S. Sandige University of Wyoming LECTRONIC DESIGNERS have placed increasing significance on digital devices since the late 1960s. This is due primarily to the greater reliability and improved accuracy gained when using electronic devices in a two-level mode (binary mode) as compared to using electronic devices in a continuous mode (analog mode). As silicon integrated circuits (ICs) became denser and more consistently reproducible over the past few decades, so did digital electronic devices. Today digital circuits and digital systems produced from digital devices can be found in every walk of life ranging from children’s toys, kitchen appliances, laboratory instruments, personal and workstation computers to space shuttle and satellite applications. The intent of this section is to present topics related to the utilization and application of digital devices. Chapter 79 establishes the foundation for digital logic elements beginning with IC, logic gates, logical families, bistable devices, and optical devices. Discussed in the next chapter are memory devices, which include integrated circuits (RAM, ROM), disk systems, magnetic tape, and optical disks. Chapter 81 on logical devices discusses switching algebra, logic circuits, registers, programmable arrays (PAL, FPGA), and arithmetic logic units. The next chapter explains the microprocessor, perhaps the best-known digital device. The topics covered include practical microprocessors and microprocessor applications. Chapter 83 on displays consists of the lightemitting diode, the liquid-crystal display, the cathode ray tube, and the plasma display. The gathering of digital E
information, referred to as data acquisition, is discussed next. No digital system is released to production without extensive testing. Chapter 85 presents methods of testing and design for testing The variety of topics presented in this section should provide readers with a contemporary overview of digital devices and their applications. To obtain additional information, the reader may refer to the References and Further Information in each chapter Nomenclature Symbol Quantity 入 radiation wavelength nm average magnification factor coefficient electron mobility luminance off the projection screen photon frequency brightness contrast mμnvpRRS photon momentum kg. m/s CMrR common-mode rejection recombination rate ratio festivity C contrast ratio mitting screen surface diameter ignal-to-noise ratio E band gap energy add time screen efficiency focal length propagation delay time aximum flux transmission ratio Plancks constant 6.626× hTTt transmission of faceplate 10-3J·s lifetime quantum efficiency qvv critical angle beam current accelerating voltage luminance creen voltage
© 2000 by CRC Press LLC information, referred to as data acquisition, is discussed next. No digital system is released to production without extensive testing. Chapter 85 presents methods of testing and design for testing. The variety of topics presented in this section should provide readers with a contemporary overview of digital devices and their applications. To obtain additional information, the reader may refer to the References and Further Information in each chapter. Nomenclature Symbol Quantity Unit A area m2 a average absorption coefficient B luminance off the projection screen C brightness contrast CMRR common-mode rejection ratio CR contrast ratio d diameter m Eg band gap energy eV e screen efficiency lumen/W f focal length m F maximum flux lumen h Planck’s constant 6.626 ¥ 10–34 J·s h quantum efficiency I beam current amp L luminance cd/m2 L raster luminance Symbol Quantity Unit l radiation wavelength nm m magnification factor mn electron mobility n aperture n photon frequency Hz p photon momentum kg · m/s R recombination rate ns Ri reflectivity S emitting screen surface m2 SNR signal-to-noise ratio tadd add time ns th hold time ns tpd propagation delay time ns T transmission ratio T transmission of faceplate t lifetime ns qc critical angle degree VB accelerating voltage V Vs screen voltage V 8574/sn08/frame Page 1768 Saturday, May 23, 1998 4:15 PM