●0 BIST的目标 ●● ●●@ Reduce input/output pin signal traffic. Permit easy circuit initialization and observation. Eliminate as much test pattern generation as possible. Achieve fair fault coverages on general class of failure mode. ●Reduce test time. Execute at-speed testing. Test circuit during burn-in. BIST Goal 2021/8/18 集成电路可测性设计 62021/8/18 集成电路可测性设计 6 BIST 的目标  Reduce input/output pin signal traffic.  Permit easy circuit initialization and observation.  Eliminate as much test pattern generation as possible.  Achieve fair fault coverages on general class of failure mode.  Reduce test time.  Execute at-speed testing.  Test circuit during burn-in. BIST Goal