● ●0 测试复杂性 ●●●● ●●● Size Number of Test Algorithm Operations X log2n m32 2 1Mb 0.06 1.26 64.5 18.3hr 4 Mb 0.25 5.54 515.4 293.2hr 16 Mb 1.01 24.16 1.2hr 4691.3hr 64 Mb 4.03 104.7 9.2hr 75060.0hr 256Mb 16.11 451.0 73.3hr 1200959.9hr 1Gb 64.43 1932.8 586.4hr 19215358.4hr 2 Gb 128.9 3994.4 1658.6hr76861433.7 hr Time in seconds 2021/8/18 集成电路可测性设计 102021/8/18 集成电路可测性设计 10 n 1 Mb 4 Mb 16 Mb 64 Mb 256 Mb 1 Gb 2 Gb n 0.06 0.25 1.01 4.03 16.11 64.43 128.9 n X log2n 1.26 5.54 24.16 104.7 451.0 1932.8 3994.4 n3/2 64.5 515.4 1.2 hr 9.2 hr 73.3 hr 586.4 hr 1658.6 hr n2 18.3 hr 293.2 hr 4691.3 hr 75060.0 hr 1200959.9 hr 19215358.4 hr 76861433.7 hr Size Number of Test Algorithm Operations 测试复杂性 Time in seconds