85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

力学实验 热学实验 光学实验 电磁学实验 电工学实验 电子线路实验 数字电子技术实验 近代物理实验 中学物理实验研究

84.1 Introduction 84.2 The Analog and Digital Signal Interface 84.3 Analog Signal Conditioning 84.4 Sample-and-Hold and A/D Techniques in Data Acquisition

83.1 Light-Emitting Diodes Semiconductor Device Principles • Semiconductor Materials • Device Efficiency • Interfacing 83.2 Liquid-Crystal Displays Principle of Operation • Interfacing 83.3 The Cathode Ray Tube

containing the components of a computer central processor, complete with instruction processing unit, arithmetic, interrupt , and basic communication facilities. Such devices have been around since the early 1970s and have greatly benefitted from the continuing

100.1 Models Classes of Systems to Be Modeled • Two Major Approaches to Modeling • Forms of the Model • Nonuniqueness • Approximation of Continuous Systems by Discrete Models 100.2 Dynamic Response

99.1 Introduction 99.2 History 99.3 The Internet Today

98.1 Introduction 98.2 Definitions of Failure, Fault, and Error 98.3 Failure Rate and Reliability 98.4 Relationship Between Reliability and Failure Rate 98.5 Mean Time to Failure 98.6 Mean Time to Repair 98.7 Mean Time Between Failures

97.1 Computer and Communications Security Physical Security Cryptology Software Security Hardware Security Network Security Personnel Security 97.2 Fundamentals of Cryptography Central Paradigms Pseudorandomness Zero-Knowledge

96.1 Introduction 96.2 Types of Operating Systems 96.3 Distributed Computing Systems 96.4 Fault-Tolerant Systems 96.5 Parallel Processing 96.6 Real-Time Systems 96.7 Operating System Structure 96.8 Industry Standards 96.9 Conclusions