High Speed Op Amp Distortion High Frequency Two-Tone Generation Using Spectrum Analyzers in High Frequency Low Distortion Measurements Measuring ADC Distortion using FFTs FFT Testing

Data Acquisition System Considerations Multiplexing Filtering Considerations for Data Acquisition Systems SHA and ADC Settling Time Requirements in Multiplexed Applications Complete Data Acquisition Systems on a Chip Multiplexing into Sigma-Delta ADCs Simultaneous Sampling Systems

Fundamentals of Undersampling Increasing ADC SFDR and ENOB using External SHAs Use of Dither Signals to Increase ADC Dynamic Range Effect of ADC Linearity and Resolution on SFDR and Noise in Digital Spectral Analysis Applications Future Trends in Undersampling ADCs

8.1软件测试的基本概念 8.2软件测试方法 8.3测试用例的设计 8.4软件测试的步骤 8.5调试 8.6软件可靠性 8.7测试工具

Driving Capacitive Loads Cable Driving Single-Supply Considerations Application Circuits

Rail-to-Rail Input Stages Rail-to-Rail Output Stages Single-Supply Instrumentation Amplifiers

1、基本概念 2、 基本方法（极差分析法） 3、 正交试验原理解析

通过本章的学习，了解抽样调查 的有关基本概念，掌握样本的抽 取技术和参数的推断方法，明确 抽样方案设计的基本原理

7.1 基本概念 7.2 系统结构 7.3 实例分析 7.4 系统设计与实现 7.5 开发工具与环境 7.6 专家系统的发展

7.1 基本概念 7.2 系统结构 7.3 实例分析 7.4 系统设计与实现 7.5 开发工具与环境 7.6 专家系统的发展