工程科学学报，第37卷，第1期：50-56,2015年1月 Chinese Journal of Engineering,Vol.37,No.1:50-56,January 2015 D0l:10.13374/j.issn2095-9389.2015.01.008;http://journals..ustb.edu.cn 取向硅钢薄带形变再结晶组织及织构演变 毕 娜，张 宁，杨平四 北京科技大学材料科学与工程学院，北京100083 ☒通信作者，E-mail:yan@mater.ustb.edu.cn 摘要利用背散射电子衍射微织构分析技术及X射线衍射织构分析技术，结合对取向硅钢薄带再结晶各阶段退火板磁性 能的分析，系统研究了其形变再结晶过程中的组织及织构演变.结果表明，薄带内原始高斯晶粒取向发生绕TD轴向{111} 112)的转变，同时晶粒取向还表现出绕RD轴的附加转动，这种附加转动及其导致的表层微弱立方形变组织可为再结晶立 方织构的形成提供核心.退火各阶段样品磁性能的变化对应了{110}-{10d〈001〉有益织构及其他织构的强弱转变以及再 结晶晶粒不均匀程度的变化，综合织构类型及晶粒尺寸的变化推断发生了二次及三次再结晶过程.升温过程再结晶织构演 变主要体现了织构诱发机制，也即与基体存在绕001)轴取向关系的晶粒长大优势结合高斯织构的抑制效应发挥作用：而在 高温长时间保温后三次再结品过程，{110}低表面能诱发异常长大发挥主要作用使得最终得到锋锐的高斯织构. 关键词取向硅钢：薄带：织构：形变；再结晶 分类号TG142.77 Deformation and recrystallization texture and microstructure evolution of thin grain-oriented silicon steel sheets BI Na,ZHANG Ning,YANG Ping School of Materials Science and Engineering.University of Science and Technology Beijing,Beijing 100083,China Corresponding author,E-mail:yangp@mater.ustb.edu.cn ABSTRACT Combined with magnetic property measurements of thin grain-oriented silicon steel sheets annealed to different recrys- tallization stages,the deformation and recrystallization texture and microstructure evolution of the sheets was analyzed by using the electron back-scattering diffraction (EBSD)micro-texture analysis technique and X-ray diffraction texture analysis technique.The results show that the deformation texture transforms from (110 (001)to (111 (112)about the transverse direction.Meanwhile,it should be noticed that additional crystal rotation about RD which leads to the occurrence of a weak (001 (100)texture near the sheet surface appears in deformed grains,thus the origin of a cube recrystallization texture can be explained.As the annealing temperature increases,there occur abnormal grain growth and changes in magnetic properties,which are bound up with texture evolution including a beneficial (110)-(100 (001)texture and other weak texture components.Taking both abnormal grain growth and texture evolu- tion into consideration,it is deduced that secondary and tertiary recrystallization occur.There exists crystallographic rotation about the 001)axis between different kinds of textural components at different recrystallization stages,so the recrystallization texture evolution of the sheets is believed to be driven by the growth dominance of grains having a (100)rotational relationship with primary grains and the inhibition effect of the sharp Goss matrix.On the other hand,the abnormal growth of Goss grains induced by the strong advantage of (110 surface energy leads to a sharp Goss texture during tertiary recrystallization after annealing at high temperature for long time. KEY WORDS silicon steel:sheets:textures;deformation:recrystallization 收稿日期：2013-09-21 基金项目：国家自然科学基金资助项目(51071024)工程科学学报，第 37 卷，第 1 期: 50--56，2015 年 1 月 Chinese Journal of Engineering，Vol． 37，No． 1: 50--56，January 2015 DOI: 10． 13374 /j． issn2095--9389． 2015． 01． 008; http: / /journals． ustb． edu． cn 取向硅钢薄带形变再结晶组织及织构演变 毕 娜，张 宁，杨 平 北京科技大学材料科学与工程学院，北京 100083  通信作者，E-mail: yangp@ mater． ustb． edu． cn 摘 要 利用背散射电子衍射微织构分析技术及 X 射线衍射织构分析技术，结合对取向硅钢薄带再结晶各阶段退火板磁性 能的分析，系统研究了其形变再结晶过程中的组织及织构演变． 结果表明，薄带内原始高斯晶粒取向发生绕 TD 轴向{ 111} 〈112〉的转变，同时晶粒取向还表现出绕 ＲD 轴的附加转动，这种附加转动及其导致的表层微弱立方形变组织可为再结晶立 方织构的形成提供核心． 退火各阶段样品磁性能的变化对应了{ 110} － { 100} 〈001〉有益织构及其他织构的强弱转变以及再 结晶晶粒不均匀程度的变化，综合织构类型及晶粒尺寸的变化推断发生了二次及三次再结晶过程． 升温过程再结晶织构演 变主要体现了织构诱发机制，也即与基体存在绕〈001〉轴取向关系的晶粒长大优势结合高斯织构的抑制效应发挥作用; 而在 高温长时间保温后三次再结晶过程，{ 110} 低表面能诱发异常长大发挥主要作用使得最终得到锋锐的高斯织构． 关键词 取向硅钢; 薄带; 织构; 形变; 再结晶 分类号 TG 142. 77 收稿日期: 2013--09--21 基金项目: 国家自然科学基金资助项目( 51071024) Deformation and recrystallization texture and microstructure evolution of thin grain-oriented silicon steel sheets BI Na，ZHANG Ning，YANG Ping School of Materials Science and Engineering，University of Science and Technology Beijing，Beijing 100083，China  Corresponding author，E-mail: yangp@ mater． ustb． edu． cn ABSTＲACT Combined with magnetic property measurements of thin grain-oriented silicon steel sheets annealed to different recrys￾tallization stages，the deformation and recrystallization texture and microstructure evolution of the sheets was analyzed by using the electron back-scattering diffraction ( EBSD) micro-texture analysis technique and X-ray diffraction texture analysis technique． The results show that the deformation texture transforms from { 110} 〈001〉to { 111} 〈112〉about the transverse direction． Meanwhile，it should be noticed that additional crystal rotation about ＲD which leads to the occurrence of a weak { 001} 〈100〉texture near the sheet surface appears in deformed grains，thus the origin of a cube recrystallization texture can be explained． As the annealing temperature increases，there occur abnormal grain growth and changes in magnetic properties，which are bound up with texture evolution including a beneficial { 110} － { 100} 〈001〉texture and other weak texture components． Taking both abnormal grain growth and texture evolu￾tion into consideration，it is deduced that secondary and tertiary recrystallization occur． There exists crystallographic rotation about the 〈001〉axis between different kinds of textural components at different recrystallization stages，so the recrystallization texture evolution of the sheets is believed to be driven by the growth dominance of grains having a〈100〉rotational relationship with primary grains and the inhibition effect of the sharp Goss matrix． On the other hand，the abnormal growth of Goss grains induced by the strong advantage of { 110} surface energy leads to a sharp Goss texture during tertiary recrystallization after annealing at high temperature for long time． KEY WOＲDS silicon steel; sheets; textures; deformation; recrystallization