98.1 Introduction 98.2 Definitions of Failure, Fault, and Error 98.3 Failure Rate and Reliability 98.4 Relationship Between Reliability and Failure Rate 98.5 Mean Time to Failure 98.6 Mean Time to Repair 98.7 Mean Time Between Failures

97.1 Computer and Communications Security Physical Security Cryptology Software Security Hardware Security Network Security Personnel Security 97.2 Fundamentals of Cryptography Central Paradigms Pseudorandomness Zero-Knowledge

96.1 Introduction 96.2 Types of Operating Systems 96.3 Distributed Computing Systems 96.4 Fault-Tolerant Systems 96.5 Parallel Processing 96.6 Real-Time Systems 96.7 Operating System Structure 96.8 Industry Standards 96.9 Conclusions

95.1 Introduction 95.2 Classifications 95.3 Types of Parallel Processors

94.1 Databases Database Abstraction • Data Models • Relational Databases • Hierarchical Databases • Network Databases • Architecture of a DBMS • Data Integrity and Security • Emerging Trends 94.2 Rule-Based Expert Systems

35.1 Maxwell Equations 35.2 Constitutive Relations Anisotropic and Bianisotropic Media Biisotropic Jin Au Kong

40.1 Grounding, Shielding, and Filtering John M. Roman Grounding.Shielding.Filtering Telematics 40.2 Spectrum, Specifications, and Measurement Techniques Martin A. Uman Procedures University of Florida, Gainesville

24.1 Junction Field-Effect Transistors JFET Biasing Transfer Characteristics. JFET Output Domai Resistance. Source Follower. Frequency and Time-Domain Response. Voltage-Variable Resistor 24.2 Bipolar Transistors Biasing the Bipolar Transistor Small-Signal Operation. A Small- Signal Equivalent Circuit.low -Frequency- Performancethe

Thermal Oxidation. Diffusion. Ion Implantation.Deposition. Harold G. Parks Lithography and Pattern Transfer The University of Arizona, Tucson 23.2 Testing Built-In Self-Test- Scan. Direct Access Testing ng· Joint TestAction

Gennady Sh. Gildenblat 22.1 Physical Properties The Pennsylvania State University Energy Bands- Electrons and Holes. Transport Properties.Hall Boris Gelmont Effect. Electrical Breakdown. Optical Properties and University of Virginia