94.1 Databases Database Abstraction • Data Models • Relational Databases • Hierarchical Databases • Network Databases • Architecture of a DBMS • Data Integrity and Security • Emerging Trends 94.2 Rule-Based Expert Systems

30.1 Power Semiconductor Devices Thyristor and Triac. Gate Turn-Off Thyristor(GTO). Reverse- Conducting Thyristor(RCT) and Asymmetrical Silicon-Controlled Rectifier (ASCR). Power Transistor Power MOSFET. Insulated-Gate Bipolar Transistor (IGBT). MOS Controlled

29.1 Synthesis of Low-Pass Forms Passive and Active Filters Active Filter Classification and J W. Steadman Sensitivity. Cascaded Second-Order Sections. Passive Ladder University of wyoming

The Ideal Op Amp- Practical Op Amps- SPICE Computer Models John V.Wait University of Arizona (Retired) 27.2 Applications Noninverting Circuits 27.1 Ideal and Practical Models

26.1Introduction 26.2 Definition and Considerations Considerations in the Implementation of SMT 26.3 SMT Design, Assembly, and Test Overview

25.1 Integrated Circuit Technology Technology Perspectives. Technology Generations.National Technology Roadmap for Semiconductors Joe E.Brewer 25.2 Layout, Placement, and Routing Northrop Grumman Corporation What Is Layout?. Floorplanning Techniques.Placement

69 Broadcasting R.C. Dorf, Z. Wan, J.F. Lindsey I, D.F. Doelitzsch, J. Whitaker, M.S. Roden, S. Salek, A. H. Clegg Modulation and Demodulation. Radio. Television Systems. High-Definition Television. Digital Audio Broadcasting

59 Conventional Power Generation G.G. Karady Fossil Power Plants. Nuclear Power Plants. Geothermal Power Plants. Hydroelectric Power Plants

46 Electroacoustic Devices P. H. Rogers Transduction Mechanisms. Sensitivity and Source Level. Reciprocity Canonical Equations and Electroacoustic Coupling. Radiation Impedance.Directivity

22 Semiconductors G.S. Gildenblat, B. Gelmont, M. Milkovic, A. Elshabini-Riad, F.W. Stephenson, I.A. Bhutta, D.C. Look Physical Properties. Diodes. Electrical Equivalent Circuit Models and Device Simulators for Semiconductor Devices Electrical Characterization of Semiconductors