88.1 Introduction 88.2 Memory Hierarchies 88.3 Cache Memories 88.4 Parallel and Interleaved Memories 88.5 Virtual Memory 88.6 Research Issues

85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

西安石油大学：《大学物理实验》课程教学资源（基础实验教案）用双臂电桥测量低值电阻

84.1 Introduction 84.2 The Analog and Digital Signal Interface 84.3 Analog Signal Conditioning 84.4 Sample-and-Hold and A/D Techniques in Data Acquisition

83.1 Light-Emitting Diodes Semiconductor Device Principles • Semiconductor Materials • Device Efficiency • Interfacing 83.2 Liquid-Crystal Displays Principle of Operation • Interfacing 83.3 The Cathode Ray Tube

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