85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

84.1 Introduction 84.2 The Analog and Digital Signal Interface 84.3 Analog Signal Conditioning 84.4 Sample-and-Hold and A/D Techniques in Data Acquisition

83.1 Light-Emitting Diodes Semiconductor Device Principles • Semiconductor Materials • Device Efficiency • Interfacing 83.2 Liquid-Crystal Displays Principle of Operation • Interfacing 83.3 The Cathode Ray Tube

containing the components of a computer central processor, complete with instruction processing unit, arithmetic, interrupt , and basic communication facilities. Such devices have been around since the early 1970s and have greatly benefitted from the continuing

100.1 Models Classes of Systems to Be Modeled • Two Major Approaches to Modeling • Forms of the Model • Nonuniqueness • Approximation of Continuous Systems by Discrete Models 100.2 Dynamic Response

99.1 Introduction 99.2 History 99.3 The Internet Today

北方工业大学：电子信息工程专业留学生《Electronics Circuits II》（电子电路II）课程教学大纲

北方工业大学：电子信息工程专业留学生《Digital Signal Processing》（数字信号处理）课程教学大纲

北方工业大学：电子信息工程专业留学生《Advanced Digital SystemLaboratory》（高级数字系统实验）课程实验教学大纲

北方工业大学：电子信息工程专业《信息论与编码》课程教学大纲