4.1 数字滤波器的结构特点与表示方法 4.2 IIR滤波器的结构 4.3 FIR滤波器的结构

2.1 引言 2.2 周期序列的离散傅里叶级数（DFS） 2.3 离散傅里叶级数（DFS）的性质 2.4 有限长序列离散傅里叶变换（DFT） 2.5 离散傅里叶变换的性质 2.6 频域采样理论

西安电子科技大学出版社：面向21世纪高等学校信息工程类专业系列教材《数字信号处理 Digital Signal Processing》课程教学资源（PPT课件）封面及目录

§1.1 Introduction §1.2 Continue-time Signal §1.3 signal representation based on δ(t) §1.4 Linear time-invariant system §1.5 System unit impulse response §1.6 Fourier series of periodic signals §1.7 Fourier analyses of non-periodic signals—Fourier Transform §1.8 Fourier Transform of typical signals §1.9 Fourier Transform of typical signals §1.10 Properties of Fourier Transform §1.11 Fourier analyses of linear system

§4.1 LTI Discrete-Time Systems in the Transform Domain §4.2 The Frequency Response §4.3 Frequency Response Computation Using MATLAB §4.4 The Concept of Filtering §4.5 Phase and Group Delays §4.6 Frequency Response of the LTI Discrete-Time System §4.7 The Transfer Function §4.8 The Transfer Function §4.9 Frequency Response from Transfer Function §4.10 Types of Transfer Functions §4.11 Linear-Phase FIR Transfer Functions §4.12 Allpass Transfer Function §4.13 Minimum-Phase and Maximum-Phase Transfer Functions

§2.1 Discrete-Time Signals: Time-Domain Representation §2.2 Operations on Sequences §2.3 Basic Sequences §2.4 The Sampling Process §2.5 Discrete-Time Systems §2.6 Time-Domain Characterization of LTI Discrete-Time System §2.7 Classification of LTI Discrete-Time Systems §2.8 Correlation of Signals

电子科技大学：《数字信号处理 Digital Signal Processing》课程教学资源（英文讲义）Introduction（彭启琮）

8.1 Standards and Calibration 8.2 Thermo-Expansion Methods 8.3 Thermoelectric sensors (Thermocouples) 8.4 Electrical-Resistance Sensors 8.5 Junction Semiconductor Sensors 8.6 Digital Thermometers 8.7 Radiation Methods 8.8 Temperature-Measuring Problems in Flowing Fluids 8.9 Dynamic Response of Temperature Sensors 8.10 Heat Flux Sensors

《数字集成电路 Digital Integrated Circuit》课程教学资源（阅读资料）IC testing_Novel Applications of Deep Learning Hidden Features for Adaptive Testing

《数字集成电路 Digital Integrated Circuit》课程教学资源（阅读资料）IC testing_Design, Manufacturing & Test of Integrated Circuits in the Nanotechnology Era