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24.1 Junction Field-Effect Transistors JFET Biasing Transfer Characteristics. JFET Output Domai Resistance. Source Follower. Frequency and Time-Domain Response. Voltage-Variable Resistor 24.2 Bipolar Transistors Biasing the Bipolar Transistor Small-Signal Operation. A Small- Signal Equivalent Circuit.low -Frequency- Performancethe

Thermal Oxidation. Diffusion. Ion Implantation.Deposition. Harold G. Parks Lithography and Pattern Transfer The University of Arizona, Tucson 23.2 Testing Built-In Self-Test- Scan. Direct Access Testing ng· Joint TestAction

93.1 Introduction 93.2 Hardware Redundancy 93.3 Information Redundancy 93.4 Time Redundancy 93.5 Software Redundancy 93.6 Dependability Evaluation

88.1 Introduction 88.2 Memory Hierarchies 88.3 Cache Memories 88.4 Parallel and Interleaved Memories 88.5 Virtual Memory 88.6 Research Issues

85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

84.1 Introduction 84.2 The Analog and Digital Signal Interface 84.3 Analog Signal Conditioning 84.4 Sample-and-Hold and A/D Techniques in Data Acquisition