34.1 Introduction 34.2 Design Entry 34.3 Synthesis 34.4 Verification Timing Analysis. Simulation.Analog Simulation.Emulation 34.5 Physical Design

33.1 Introduction Motivation .Requirements 33.2 Heat Transfer Fundamentals Avram Bar-Cohen 33.3 Chip Module Thermal Resistance Definition. Internal Resistance. External Resistance.Total

31.2 Sources and Detectors Lucent Technologies Properties of Light. Absorption Coherence. Geometric Optics. Incoherent Light. Detectors, R.A.Becker

30.1 Power Semiconductor Devices Thyristor and Triac. Gate Turn-Off Thyristor(GTO). Reverse- Conducting Thyristor(RCT) and Asymmetrical Silicon-Controlled Rectifier (ASCR). Power Transistor Power MOSFET. Insulated-Gate Bipolar Transistor (IGBT). MOS Controlled

29.1 Synthesis of Low-Pass Forms Passive and Active Filters Active Filter Classification and J W. Steadman Sensitivity. Cascaded Second-Order Sections. Passive Ladder University of wyoming

93.1 Introduction 93.2 Hardware Redundancy 93.3 Information Redundancy 93.4 Time Redundancy 93.5 Software Redundancy 93.6 Dependability Evaluation

88.1 Introduction 88.2 Memory Hierarchies 88.3 Cache Memories 88.4 Parallel and Interleaved Memories 88.5 Virtual Memory 88.6 Research Issues

85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

84.1 Introduction 84.2 The Analog and Digital Signal Interface 84.3 Analog Signal Conditioning 84.4 Sample-and-Hold and A/D Techniques in Data Acquisition

83.1 Light-Emitting Diodes Semiconductor Device Principles • Semiconductor Materials • Device Efficiency • Interfacing 83.2 Liquid-Crystal Displays Principle of Operation • Interfacing 83.3 The Cathode Ray Tube