11.1 Introduction 11.2 Linear Frequency Response Plotting Paul Neudorfer 11.3 Bode Diagrams Seattle University 11.4 A Comparison of Methods 11.1 Introduction The IEEE Standard Dictionary of Electrical and Electronics Terms defines frequency response in stable

苏州大学：电子信息学院《半导体器件原理》课程教学大纲

苏州大学：电子信息学院《计算机通信与网络（含实验）》课程教学大纲

苏州大学：电子信息学院《传感与微传感基础》课程教学大纲

苏州大学：电子信息学院《半导体物理及固体物理基础》课程教学大纲

苏州大学：电子信息学院《微处理器与微计算机系统》课程教学大纲

93.1 Introduction 93.2 Hardware Redundancy 93.3 Information Redundancy 93.4 Time Redundancy 93.5 Software Redundancy 93.6 Dependability Evaluation

88.1 Introduction 88.2 Memory Hierarchies 88.3 Cache Memories 88.4 Parallel and Interleaved Memories 88.5 Virtual Memory 88.6 Research Issues

85.1 Digital IC Testing Taxonomy of Testing • Fault Models • Test Pattern Generation • Output Response Analysis 85.2 Design for Test The Testability Problem • Design for Testability • Future for Design

4.1基本概念 4.2 长度尺寸的测量 4.3 形位误差的测量 4.4 纳米测量技术