《材料测试技术及方法》课程教学资源（书籍文献）Encyclopedia of Materials Characterization，PDF电子书，C. Richard Brundle，Surfaces, Interfaces, Thin Films.pdf_大学文库

Preface to Series This Materials Series attempts to address the needs of the pract cal materials user,with an emphasis on the newer areas of surface,interface,and thin film microcharacterization.The Series is composed of the leading volume, Encyclopedia of Materials Characterization,and a set of about 10 subsequent vol- umes concentrating on characterization of individual materials classes In the fr lo 50 brief artices (cach 10-18 pages in length)ar n standard mat designed of rea acces technique descriptions and examples of their practical use.In addition to the arti- cles,there are one-page summaries for every technique,introductory summaries to groupings of related techniques,a complete glossary of acronyms,and a tabu- lar con parison of the major features of all 50 technic The 10 volumes in the Series on characterizatior of particular materials classes include silicon pro ing,me and alloys, materials integrated circuit packaging,etc.Characteri ation is approached from the mate- rials user's point of view.Thus,in general,the format is based on properties,pro- cessing steps,materials classification,etc.,rather than on a technique. The emphasis of all volumes is on surfaces,interfaces,and thin films,but the emphasis varies depending on the relative importance of these areas for the materials class cach olume reproduce the r one-page referred to that are not covered in the Encyclopedia The concept for the Series came from discussion with Marjan Bace of Manning Publications Company.A gap exists between the way materials characterization isofe presented and then eds of a large -the materials when,at the end of s or courses on analyt ques,a queston Is h material (or processing)characterization problem can be addressed the answer often is that the speaker is"an expert on the technique,not the materials aspects, and does not have experience with that particular situation."This Series is an attempt to bridge this gap by appmoaching characterization problems from the side of the o thank Marjan n from that of the analytical technic e for putting rd the pert Sha s and Yale Stra orig Wilson of Chi s Evans and A of Surfac ence Laboratories for help in further defining the Series,and the Ed tors of all th individual volumes for their efforts to produce practical,materials user based volumes. C.R Brundle C.A.Evans,Jr. ix

Preface to Series This Materialj Characterization Series attempts to address the needs of the practical materials user, with an emphasis on the newer areas of surfice, interface, and thin film microcharacterization. The Series is composed of the leading volume, Enychpedia of Materialj Characterization, and a set of about 10 subsequent volumes concentrating on characterization of individual materials classes. In the Encyclopedia, 50 brief articles (each 10-18 pages in length) are presented in a standard format designed for ease of reader access, with straightforward technique descriptions and examples of their practical use. In addition to the articles, there are one-page summaries for every technique, introductory summaries to groupings of related techniques, a complete glossary of acronyms, and a tabular comparison of the major features of all 50 techniques. The 10 volumes in the Series on characterization of particular materials classes include volumes on silicon processing, metals and alloys, catalytic materials, integrated circuit packaging, etc. Characterization is approached from the materials user’s point of view. Thus, in general, the format is based on properties, processing steps, materials classification, etc., rather than on a technique. The emphasis of all volumes is on surfaces, interfaces, and thin films, but the emphasis varies depending on the relative importance of these areas for the materials class concerned. Appendixes in each volume reproduce the relevant one-page summaries from the Encyclopedia and provide longer summaries for any techniques referred to that are not covered in the Envcbpedia The concept for the Series came firom discussion with Marjan Bace of Manning Publications Comparly. A gap exists between the way materials characterization is often presented and the needs of a large segment of the audience-the materials user, process engineer, manager, or student. In our experience, when, at the end of talks or courses on analytical techniques, a question is asked on how a particular material (or processing) characterization problem can be addressed the answer often is that the speaker is “an expert on the technique, not the materials aspects, and does not have experience with that particular situation.” This Series is an attempt to bridge this gap by approaching characterization problems from the side of the materials user rather than from that of the analytical techniques expert. We would like to thank Marjan Bace for putting forward the original concept, Shaun Wilson of Charles Evans and Associates and Yale Strausser of Surface Science Laboratories fbr help in hrther defining the Series, and the Editors of all the individual volumes for their efforts to produce practical, materials user based volumes. CR Brundle C.A. Evans,Jr. ix

Preface This volume contains 50 articles describing analytical techniques for the charac- terization of solid materials,with emphasis on surfaces,interfaces,thin films. and microanalytical approaches.It is part of the Materials Characterization Series copublished by Butterw rth-Heine nann and Manning.This volum rell as a c mpanion to the othe s in t characterization experts the articles are written to be casily accessible to the materials user,the process engineer,the manager,the student-in short to all those who are not (and probably don't intend to be)experts but who need to understand plications of the techni qu to materials problems.Too often tions are written for the ique spe cial organization of the book was difficult;certain technique could equally well have appeared in more than one place.The organizational intent of the Editors was to group techniques that have a similar physical basis,or that provide similar types of information.This is not the traditional organiza- tion of an wher e articles are ordered alphabetically.such ere,in par L se many the e multiple pos. sible acronym ns (ar Acronyms Glossary is pro d to help the reader The articles follow a standard format for each technique:A clear description of the technique,the range of information it provides,the range of materials to which it is applicable,a few typical examples,and some comparison to other related technic ques.Each technique has a ick referen on nary in Chapter paragraph and a tabular te broadly tha just t surfaces, interfaces,or thin films;for example X-Ray Diffraction and Infrared Spectros- copy,which have been used for half a century in bulk solid and liquid analysis, respectively.They are included here because they have by now been developed to also apply to surfaces.A few techniques that are applied alm nost entirely to bulk on Diffra tion)are i included give to ther meth use they are referred t ty the 10 materials volumes in the Series.Some techniques were left out because they were considered to be too restricted to specific applications or materials. We wish to thank all the many contributors for their efforts,and their patience and restraint in dealing with the Editors who took a fairly demanding approach to establishing the format,length,style,and content of the articles.We hope the readers will consider our efforts worthwhile.Finally,we would like to thank Lee professional help as Managing C.RBrundle CA.Evans.Ir.S.Wilson

This volume contains 50 articles describing analytical techniques for the characterization of solid materials, with emphasis on surfaces, intedices, thin films, and microanalytical approaches. It is part of the Materzah Characterization Series, copublished by Buttenvorth-Heinemann and Manning. This volume can serve as a stand-alone reference as well as a companion to the other volumes in the Series which deal with individual materials classes. Though authored by professional characterization experts the articles are written to be easily accessible to the materials user, the process engineer, the manager, the student-in short to all those who are not (and probably don’t intend to be) experts but who need to understand the potential applications of the techniques to materials problems. Too often, technique descriptions are written for the technique specialist. With 50 articles, organization of the book was difficult; certain techniques could equally well have appeared in more than one place. The organizational intent of the Editors was to group techniques that have a similar physical basis, or that provide similar types of information. This is not the traditional organization of an encyclopedia, where articles are ordered alphabetically. Such ordering seemed less useful here, in part because many of the techniques have multiple possible acronyms (an Acronym Glossavy is provided to help the reader). The articles follow a standard format for each technique: A clear description of the technique, the range of information it provides, the range of materials to which it is applicable, a few typical examples, and some comparison to other related techniques. Each technique has a “quick reference,” one-page summary in Chapter 1 , consisting of a descriptive paragraph and a tabular summary. Some of the techniques included apply more broadly than just to surhces, interhces, or thin films; for example X-Ray Diffraction and Infrared Spectroscopy, which have been used for half a century in bulk solid and liquid analysis, respectively. They are included here because they have by now been developed to also apply to surfaces. A fay techniques that are applied almost entirely to bulk materials (e.g., Neutron Diffraction) are included because they give complementary information to other methods or because they are referred to significantly in the 10 materials volumes in the Series. Some techniques were left out because they were considered to be too restricted to specific applications or materials. We wish to thank all the many contributors for their efforts, and their patience and restraint in dealing with the Editors who took a hirly demanding approach to establishing the format, length, style, and content of the articles. We hope the readers will consider our efforts worthwhile. Finally, we would like to thank Lee Fitzpatrick of Manning Publications Co. for her professional help as Managing Editor. C. R. Brund. CA. Evans, /r. S. Mhon